{"product_id":"0845221006802","title":"Die Herzogin von Chicago","description":"The ongoing integration density increase changes the demands on failure analysis methods for ICs drastically. \"Laser Voltage Probing\" (LVP) is an all-optical laser-based technique that acquires waveforms through the silicon backside. Although widely used in failure analysis labs, the knowledge about LVP signal origin is still very low. A detailed investigation of the signal origin is presented, using a modified LVP setup, which employed a 1319 or 1064 nm CW laser. Three new measurement methods were introduced, extracting frequency-information with a spectrum analyzer in opposition to the standard time-domain waveform acquisition with an oscilloscope. Signal-to-voltage correlations and modulation amplitude and sign maps were performed for a broad spectrum of MOSFETs: from 10 µm (to study signal sources) to 65 nm gates (effects on structures with decreased dimensions). These low-noise frequency-domain measurement methods enabled very short signal acquisition times (seconds to minutes). A concise model, describing the interaction of laser light and device activity, was built, explaining the signal sources and enabling the forecast of signal levels for future technologies and scaling.","brand":"NAXOS OF AMERICA, INC.","offers":[{"title":"Default Title","offer_id":47094427156720,"sku":"0845221006802","price":29.99,"currency_code":"USD","in_stock":false}],"url":"https:\/\/shop-qa.barnesandnoble.com\/products\/0845221006802","provider":"Barnes \u0026 Noble (DEV)","version":"1.0","type":"link"}