{"product_id":"9780195092042","title":"Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces","description":"This edition updates the survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.","brand":"Oxford University Press, USA","offers":[{"title":"Default Title","offer_id":47046566117616,"sku":"9780195092042","price":255.0,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0737\/7593\/9824\/files\/9780195092042_p0.jpg?v=1763663778","url":"https:\/\/shop-qa.barnesandnoble.com\/products\/9780195092042","provider":"Barnes \u0026 Noble (DEV)","version":"1.0","type":"link"}