{"product_id":"9780199796212","title":"An Introduction to Mixed-Signal IC Test and Measurement","description":"\u003cp\u003eWith the proliferation of complex semiconductor devices containing digital, analog, mixed-signal, and radio-frequency circuits, today's engineer must be fluent in all four circuit types. Written for advanced undergraduate and graduate-level students, as well as engineering professionals, An Introduction to Mixed-Signal IC Test and Measurement, Second Edition, encompasses analog, mixed-signal and radio-frequency circuits tests, with many relevant industrial examples. The text assumes a solid background in analog and digital circuits and a working knowledge of computers and computer programming.\u003c\/p\u003e\u003cp\u003eAn Introduction to Mixed-Signal IC Test and Measurement, Second Edition, includes examples and illustrations—featuring state-of-the-art industrial technology—to enrich and enliven the text. The book also introduces large-scale mixed-signal circuit and individual circuit tests, discusses the value-added benefits of mixed-signal IC testing to a manufacturer's product, and clearly defines the role of the test engineer.\u003cbr\u003e\u003c\/p\u003e","brand":"Oxford University Press, USA","offers":[{"title":"Default Title","offer_id":47023029944560,"sku":"9780199796212","price":159.95,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0737\/7593\/9824\/files\/9780199796212_p0.jpg?v=1763673328","url":"https:\/\/shop-qa.barnesandnoble.com\/products\/9780199796212","provider":"Barnes \u0026 Noble (DEV)","version":"1.0","type":"link"}