{"product_id":"9780306472923","title":"Scanning Electron Microscopy and X-ray Microanalysis: Third Edition","description":"\u003cp\u003eThis text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e","brand":"Springer US","offers":[{"title":"Default Title","offer_id":47027502055664,"sku":"9780306472923","price":119.99,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0737\/7593\/9824\/files\/9780306472923_p0.jpg?v=1763671003","url":"https:\/\/shop-qa.barnesandnoble.com\/products\/9780306472923","provider":"Barnes \u0026 Noble (DEV)","version":"1.0","type":"link"}