{"product_id":"9780387286679","title":"Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale","description":"\u003cp\u003eScanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.\u003c\/p\u003e","brand":"Springer New York","offers":[{"title":"Default Title","offer_id":47013041471728,"sku":"9780387286679","price":449.99,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0737\/7593\/9824\/files\/9780387286679_p0.jpg?v=1763695509","url":"https:\/\/shop-qa.barnesandnoble.com\/products\/9780387286679","provider":"Barnes \u0026 Noble (DEV)","version":"1.0","type":"link"}