{"product_id":"9780819488930","title":"Reliability, Packaging, Testing, and Characterization of MEMS\/MOEMS and Nanodevices XI","description":"","brand":"SPIE Press","offers":[{"title":"Default Title","offer_id":47016853962992,"sku":"9780819488930","price":60.0,"currency_code":"USD","in_stock":false}],"url":"https:\/\/shop-qa.barnesandnoble.com\/products\/9780819488930","provider":"Barnes \u0026 Noble (DEV)","version":"1.0","type":"link"}