{"product_id":"9780863417450","title":"Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach","description":"\u003cp\u003eThis book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.\u003c\/p\u003e","brand":"The Institution of Engineering and Technology","offers":[{"title":"Default Title","offer_id":47031712121072,"sku":"9780863417450","price":113.0,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0737\/7593\/9824\/files\/9780863417450_p0.jpg?v=1769911777","url":"https:\/\/shop-qa.barnesandnoble.com\/products\/9780863417450","provider":"Barnes \u0026 Noble (DEV)","version":"1.0","type":"link"}