{"product_id":"9781118589243","title":"Cluster Secondary Ion Mass Spectrometry: Principles and Applications","description":"\u003cp\u003e\u003cb\u003eExplores the impact of the latest breakthroughs in cluster SIMS technology\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eCluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method.\u003c\/p\u003e \u003cp\u003eWith contributions from leading mass spectrometry researchers around the world, \u003ci\u003eCluster Secondary Ion Mass Spectrometry: Principles and Applications\u003c\/i\u003e describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include:\u003c\/p\u003e \u003cul\u003e \u003cli\u003eCluster SIMS theory and modeling\u003c\/li\u003e \u003cli\u003eCluster ion source types and performance expectations\u003c\/li\u003e \u003cli\u003eCluster ion beams for surface analysis experiments\u003c\/li\u003e \u003cli\u003eMolecular depth profiling and 3-D analysis with cluster ion beams\u003c\/li\u003e \u003cli\u003eSpecialty applications ranging from biological samples analysis to semiconductors\/metals analysis\u003c\/li\u003e \u003cli\u003eFuture challenges and prospects for cluster SIMS\u003c\/li\u003e \u003c\/ul\u003e \u003cp\u003eThis book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. \u003ci\u003eCluster Secondary Ion Mass Spectrometry: Principles and Applications\u003c\/i\u003e is a must-have read for any researcher in the surface analysis and\/or imaging mass spectrometry fields.\u003c\/p\u003e","brand":"Wiley","offers":[{"title":"Default Title","offer_id":47107278143728,"sku":"9781118589243","price":123.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0737\/7593\/9824\/files\/9781118589243_p0.jpg?v=1763694526","url":"https:\/\/shop-qa.barnesandnoble.com\/products\/9781118589243","provider":"Barnes \u0026 Noble (DEV)","version":"1.0","type":"link"}