{"product_id":"9781118916773","title":"Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices","description":"Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)\u003cbr\u003e • Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations\u003cbr\u003e • Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission\u003cbr\u003e • Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)\u003cbr\u003e • Details how data collection\/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions\u003cbr\u003e • Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other","brand":"Wiley","offers":[{"title":"Default Title","offer_id":47121553359088,"sku":"9781118916773","price":134.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0737\/7593\/9824\/files\/9781118916773_p0.jpg?v=1769889655","url":"https:\/\/shop-qa.barnesandnoble.com\/products\/9781118916773","provider":"Barnes \u0026 Noble (DEV)","version":"1.0","type":"link"}