{"product_id":"9781489988478","title":"High Quality Test Pattern Generation and Boolean Satisfiability","description":"This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests as well as tests with long propagation paths to detect small delay defects.","brand":"Springer New York","offers":[{"title":"Default Title","offer_id":47046689292528,"sku":"9781489988478","price":129.99,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0737\/7593\/9824\/files\/9781489988478_p0.jpg?v=1763655302","url":"https:\/\/shop-qa.barnesandnoble.com\/products\/9781489988478","provider":"Barnes \u0026 Noble (DEV)","version":"1.0","type":"link"}