{"product_id":"9781598293500","title":"An Introduction To Logic Circuit Testing","description":"An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits\/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips.\u003cp\u003eTable of Contents: Introduction \/ Fault Detection in Logic Circuits \/ Design for Testability \/ Built-in Self-Test \/ References\u003c\/p\u003e","brand":"Morgan and Claypool Publishers","offers":[{"title":"Default Title","offer_id":47036921708784,"sku":"9781598293500","price":35.0,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0737\/7593\/9824\/files\/9781598293500_p0.jpg?v=1763813904","url":"https:\/\/shop-qa.barnesandnoble.com\/products\/9781598293500","provider":"Barnes \u0026 Noble (DEV)","version":"1.0","type":"link"}