{"product_id":"9781630810566","title":"On-Wafer Microwave Measurements and De-embedding","description":"This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.","brand":"Artech House, Incorporated","offers":[{"title":"Default Title","offer_id":47038272405744,"sku":"9781630810566","price":169.0,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0737\/7593\/9824\/files\/9781630810566_p0.jpg?v=1763671022","url":"https:\/\/shop-qa.barnesandnoble.com\/products\/9781630810566","provider":"Barnes \u0026 Noble (DEV)","version":"1.0","type":"link"}