{"product_id":"9781848167896","title":"Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis","description":"\u003cp\u003eThe basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.\u003c\/p\u003e","brand":"Imperial College Press","offers":[{"title":"Default Title","offer_id":47019036147952,"sku":"9781848167896","price":155.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0737\/7593\/9824\/files\/9781848167896_p0.jpg?v=1772546848","url":"https:\/\/shop-qa.barnesandnoble.com\/products\/9781848167896","provider":"Barnes \u0026 Noble (DEV)","version":"1.0","type":"link"}