{"product_id":"9781908043825","title":"Software Trace and Log Analysis: A Pattern Reference","description":"\u003cp\u003eGeneral trace and log analysis patterns allow application of uniform problem detection and solving approach across diverse software environments. This pattern language covers any execution artifact from a small debugging trace to a distributed log with billions of messages from hundreds of computers, thousands of software components, threads, and processes. Pattern-oriented trace and log analysis is applicable to troubleshooting and debugging Windows, Mac OS X, Linux, FreeBSD, Android, iOS, z\/OS, and any other possible computer platform including networking and IoT. Its pattern catalog is a part of pattern-oriented software diagnostics, forensics, prognostics, root cause analysis, and debugging developed by Software Diagnostics Institute (DumpAnalysis.org + TraceAnalysis.org). This reference reprints with corrections 133 patterns originally published in Memory Dump Analysis Anthology volumes 3 - 9 and Software Diagnostics Library (former Crash Dump Analysis blog, DumpAnalysis.org\/blog). Full-color diagrams accompany most pattern descriptions. The second edition includes 33 more patterns and improved pattern index.\u003c\/p\u003e\u003cp\u003e\u003c\/p\u003e","brand":"Opentask","offers":[{"title":"Default Title","offer_id":47048331886832,"sku":"9781908043825","price":40.0,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0737\/7593\/9824\/files\/9781908043825_p0.jpg?v=1763620657","url":"https:\/\/shop-qa.barnesandnoble.com\/products\/9781908043825","provider":"Barnes \u0026 Noble (DEV)","version":"1.0","type":"link"}