{"product_id":"9783527636938","title":"Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications","description":"Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.\u003cbr\u003e \u003cbr\u003e From a Review of the First Edition (edited by Bubert and Jenett)\u003cbr\u003e \"... a useful resource...\"\u003cbr\u003e (Journal of the American Chemical Society)","brand":"Wiley","offers":[{"title":"Default Title","offer_id":47137985233136,"sku":"9783527636938","price":212.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0737\/7593\/9824\/files\/9783527636938_p0.jpg?v=1763730030","url":"https:\/\/shop-qa.barnesandnoble.com\/products\/9783527636938","provider":"Barnes \u0026 Noble (DEV)","version":"1.0","type":"link"}