{"product_id":"9789814390972","title":"Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Characterization (In 2 Volumes): (In 2 Volumes)","description":"\u003cp\u003e\u003ci\u003e\"... These volumes provide the very latest in this critical technology and are an invaluable resource for scientists in both academia and industry concerned with the semiconductor future and all of science.\"\u003c\/i\u003e\u003ci\u003eForeword by \u003cb\u003eLeonard C Feldman\u003c\/b\u003e\u003cbr\u003e (Director Institute for Advanced Materials, Devices and Nanotechnology, Rutgers University, USA)\u003c\/i\u003e\u003c\/p\u003e\u003cb\u003eHighlights\u003c\/b\u003e\u003cbr\u003e\u003cul\u003e\n\u003cli\u003e\n\u003cb\u003eFirst comprehensive handbook\u003c\/b\u003e on instrumentation and techniques for semiconductor nanostructure characterization\u003c\/li\u003e\n\u003cli\u003e\n\u003cb\u003eMore than 900 references\u003c\/b\u003e providing up-to-date information\u003c\/li\u003e \u003cli\u003eWith \u003cb\u003eover 260 illustrations\u003c\/b\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e\u003cbr\u003eAs we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.\u003cp\u003e\u003cb\u003eForeword\u003c\/b\u003e\u003cbr\u003eForeword (47k)\u003c\/p\u003e\u003cp\u003e\u003cb\u003eSample Chapter(s)\u003c\/b\u003e\u003cbr\u003eIntroduction (47k)\u003cbr\u003e\u003c\/p\u003e\u003cb\u003eContents:\u003c\/b\u003e\u003cbr\u003e\u003cul\u003e  \u003cli\u003e\n\u003cb\u003e\u003ci\u003eVolume 1:\u003c\/i\u003e\u003c\/b\u003e  \u003cul\u003e\u003cli\u003e\n\u003cb\u003eElectron Microscopies:\u003c\/b\u003e\u003cul\u003e\n\u003cli\u003eCharacterization of Semiconductor Nanostructures by Scanning Electron Microscopy \u003ci\u003e(Lynne M Gignac\u0026amp;Oliver C Wells)\u003c\/i\u003e\n\u003c\/li\u003e\n\u003cli\u003eTransmission Electron Microscopy and Ultra-high Vacuum Transmission Electron Microscopy of Semiconductor Nanostructures \u003ci\u003e(Suneel Kodambaka\u0026amp;Frances M Ross)\u003c\/i\u003e\n\u003c\/li\u003e\n\u003cli\u003eAberration Corrected Electron Microscopy \u003ci\u003e(Philip E Batson)\u003c\/i\u003e\n\u003c\/li\u003e\n\u003cli\u003eLow-Energy Electron Microscopy for Nanoscale Characterization \u003ci\u003e(James B Hannon\u0026amp;Rudolf M Tromp)\u003c\/i\u003e\n\u003c\/li\u003e\n\u003cli\u003eUltrafast Microscopy of Plasmon Dynamics in Nanostructured Metal Surfaces \u003ci\u003e(Hrvoje Petek\u0026amp;Atsushi Kubo)\u003c\/i\u003e\n\u003c\/li\u003e\n\u003cli\u003eX-Ray Diffraction Methods for Studying Strain and Composition in Epitaxial Nanostructured Systems \u003ci\u003e(Angelo Malachias, Raul Freitas, Sérgio L Morelhão, Rogério Magalhães-Paniago, Stefan Kycia\u0026amp;Gilberto Medeiros-Ribeiro)\u003c\/i\u003e\n\u003c\/li\u003e\n\u003cli\u003eStress Determination in Semiconductor Nanostructures Using X-Ray Diffraction \u003ci\u003e(Conal E Murry\u0026amp;I Cevdet Noyan)\u003c\/i\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e  \u003c\/li\u003e\u003c\/ul\u003e  \u003c\/li\u003e  \u003cli\u003e\n\u003cb\u003e\u003ci\u003eVolume 2:\u003c\/i\u003e\u003c\/b\u003e  \u003cul\u003e\n\u003cli\u003e\n\u003cb\u003eScanning Probes:\u003c\/b\u003e\u003cul\u003e\n\u003cli\u003eAn Introduction to Scanning Probe Microscopy of Semiconductors with Case Studies Concerning Gallium Nitride and Related Materials \u003ci\u003e(Rachel Oliver)\u003c\/i\u003e\n\u003c\/li\u003e\n\u003cli\u003eSTM of Self Assembled III-V Nanostructures \u003ci\u003e(Vaishno D Dasika\u0026amp;Rachel S Goldman)\u003c\/i\u003e\n\u003c\/li\u003e\n\u003c\/ul\u003e    \u003c\/li\u003e\n\u003cli\u003e\n\u003cb\u003eAtom and Optical Probes:\u003c\/b\u003e\u003cul\u003e\n\u003cli\u003eAtom Probe Tomography for Microelectronics \u003ci\u003e(David J Larson, Ty J Prosa, Dan Lawrence, Brian P Geiser, Clive M Jones\u0026amp;Thomas F Kelly)\u003c\/i\u003e\n\u003c\/li\u003e\n\u003cli\u003eRaman Spectroscopy of Carbon Nanotubes and Graphene Materials and Devices \u003ci\u003e(Marcus Freitag\u0026amp;James C Tsang)\u003c\/i\u003e\n\u003c\/li\u003e        \u003cli\u003eSingle Nanowire Photoelectron Spectroscopy \u003ci\u003e(Carlos Aguilar\u0026amp;Richard Haight)\u003c\/i\u003e\n\u003c\/li\u003e\n\u003cli\u003eTime-Domain Thermoreflectance Measurements for Thermal Property Characterization of Nanostructures \u003ci\u003e(Scott Huxtable)\u003c\/i\u003e\n\u003c\/li\u003e    \u003c\/ul\u003e  \u003c\/li\u003e\n\u003c\/ul\u003e  \u003c\/li\u003e\n\u003c\/ul\u003e\u003cbr\u003e\u003cb\u003eReadership:\u003c\/b\u003e Advanced graduate students and professionals in physics, chemistry, materials science and nanoscience.","brand":"World Scientific Publishing Company, Incorporated","offers":[{"title":"Default Title","offer_id":47185283940592,"sku":"9789814390972","price":411.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0737\/7593\/9824\/files\/9789814390972_p0.jpg?v=1763690925","url":"https:\/\/shop-qa.barnesandnoble.com\/products\/9789814390972","provider":"Barnes \u0026 Noble (DEV)","version":"1.0","type":"link"}