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Elsevier Science

Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers: A Selection of Papers from the 9th International Symposium, Paris, France, 27 June - 1 July 2005

Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers: A Selection of Papers from the 9th International Symposium, Paris, France, 27 June - 1 July 2005

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Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers contains a selection of papers presented at PASSIVITY-9, the 9th International Symposium on the Passivation of Metals and Semiconductors and the Properties of Thin Oxide Layers, which was held in Paris, 27 June - 1 July, 2005. One hundred and twelve peer-reviewed manuscripts have been included.



The book covers all the fundamental and applied aspects of passivity and provides a relevant and updated view of the advances and new trends in the field. It is structured in ten sections:

• Growth, (Nano)structure and Composition of Passive Films
• Passivity of Semiconductors
• Electronic Properties of Passive Films
• Passivity Issues in Biological Systems
• Passivity in High-Temperature Water
• Mechanical Properties of Passive Films,
• Passivity Issues in Stress Corrosion Cracking and Tribocorrosion
• Passivity Breakdown and Localized Corrosion
• Modeling and Simulation
• Surface Modifications and Inhibitors (for Improved Corrosion Resistance and/or Adhesion)

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