Strain and Dislocation Gradients from Diffraction: Spatially-Resolved Local Structure and Defects

This book brings together the pioneering work of scientists developing new diffraction methods to characterize local crystal structure and defects with grain and subgrain spatial resolution. The ability to resolve local structure and defects is critical as materials are inherently inhomogeneous. By pushing the limits of spatially-resolved diffraction, these pioneers have now demonstrated the ability to resolve complex material is into much simpler subunits. These efforts are poised to revolutionize our understanding of materials and to become essential tools for materials research. The ultimate impact of modern spatially-resolved diffraction methods is only partially understood by the materials science and applied physics community and there is little recognition of the demonstration experiments that have now been successfully undertaken. This book clarifies the current cutting edge developments projects the future impact of spatially-resolved diffraction, and illustrates the practical tools required to realize the dream of spatially-resolved structure and defect characterization. Specifically, the book addresses three important questions. (1) What is the current state-of-the art in this field? (2) What are the advantages, capabilities and limitations of competing method? (3) What are the practical tools needed for spatially-resolved diffraction method?